Research news, analysis and insights

A non-invasive beam profile monitor for charged particle beams

Non-interceptive beam profile monitors are highly desirable in almost all particle accelerators. Such techniques are especially valuable in applications where real time monitoring of the beam properties is required while beam preservation and minimal influence on the vacuum are of the greatest importance.

 

Publication

Total
0
Shares
Leave a Reply

Your email address will not be published. Required fields are marked *

Previous Article

Citizens’ political engagement and their categorization of political activities

Next Article

SMARTfarm Learning Hub

×
You have free insight(s) remaining for this month.
Related Posts
error: Faculti Content is protected. Please check our Privacy Policy and Terms and Conditions.

Add the Faculti Web App to your Mobile or Desktop homescreen

Install
×